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DIGITAL LINK MEASURING INSTRUMENTS

For R&D and Manufacturing of Digital Devices and Equipment

DIGITAL DATA ANALYZER

MP1630B

10 kHz to 200 MHz

GPIB

OPTION

The MP1630B is a general-purpose bit error measuring instrument

that can provide simultaneous measurements of multi-channel sig-

nals and burst signal measurements up to 200 MHz.

The MP1630B is not only for continuous signals – it can measure

burst-signal bit error rates as well. Consequently, it is easily able to

handle burst signals used by TDMA (Time Domain Multiplex Access)

methods and packet/cell transmissions, etc. Both a pulse pattern

generator unit and an error detector unit can be installed in the

MP1630B to measure simultaneously parallel data for 16 channels

using just one unit.

Features

•

16 channel PPG and ED in one cabinet

•

Eye diagram measurement based on BER

Applications

•

Testing multi-channel modules for optical interconnection

•

E/O, O/E evaluation for optical networks (PON/PDS)

•

Testing SDH/ATM equipment and modules

•

Testing cable modems for digital CATV

•

R&D on TDMA

•

R&D on wireless LAN peripherals

•

Evaluating next-generation PC interfaces (fiber channel, IEEE 1394,

SSA, ATM-25)

•

Evaluating digital demodulators including QPSK/QAM, etc.

•

Evaluating IrDA communications equipment

•

Evaluating communications LSIs, ASICs/FPGAs, and CCDs, etc.

Performance and functions

•

Simultaneous bit error measurement of 16 channels

The MP1630B has 16-channel Pulse Pattern Generator and Error

Detector units and can measure bit errors in parallel and simultane-

ously. Using the MP1630B shortens the time required to measure

each device to 1/N, thereby greatly improving production efficiency.

•

For both continuous and burst data

Continuous data is used in the PDH/SDH transmission system; burst

data is used in the PON (Passive Optical Network) subscriber TDMA

transmission system, as well as in the burst cell unit ATM-PON trans-

mission system. The MP1630B can handle bit error measurement of

both continuous and burst data. It can output burst data for up to 16

channels, and the burst cycle, guard time, preamble length, and data

length can all be varied.

•

Mixed pattern generation, selective BER measurement

With the MP1630B, a test pattern can be selected and set for each

channel. Not only can both PRGM and PRBS patterns be used, but

a mixed pattern composed of both PRGM and PRBS patterns can be

generated, too. The packet type and cell type data can be configured

smoothly from the overhead and payload parts. Moreover, the pat-

tern field can split in two to 32 blocks, and a PRGM or PRBS pattern

can be allocated to each column individually. As a result, it is possi-

ble to create pseudo-test signals for SDH/ATM, etc., as well as sig-

nals for evaluating complex communication protocols.

32 block mixed pattern setting screen

•

Superior basic functions

A high-performance frequency synthesizer is built into the MP1630B.

It generates stable, accurate signals with high resolution in the 10

kHz to 200 MHz band. In addition, when the optional digital modula-

tor function is used, the jitter tolerance of communications equipment

and devices can also be measured.

In addition to TTL, LVTTL, ECL, and PECL, the pulse pattern gener-

ator clock and data output levels can be set to any output (0.25 to 2.5

V at 50 Ω termination; 0.5 to 5.0 V at high) for a variety of interfaces.

The data and clock output delay can be varied at high resolution for

each channel, and there is no need to adjust the cable length for

each signal.

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