Anritsu MP1777A Manual de usuario descargar pdf (Pagina 4)

Conforming to Bit Rates from 1.5 Mbit/s to 10 Gbit/s in

a Single Unit

The MP1570A conforms to ITU-T Rec. G.703 (2, 8, 34, 139,

1.5, and 45 Mbit/s), G.703 and G.958 (52, 156, 622, 2,488, and

9,953 Mbit/s), and allows the user to select plug-in units for

different applications, including SONET, SDH, ATM, jitter and

wander tests.

Concatenation Mapping

The MP1570A can perform SDH and SONET tests through the

mapping routes from VC4 to VC4-64c and can also core rooter

interface tests.

Enhanced SDH and SONET Test Functions

The MP1570A can generate and detect CID patterns (ITU-T

Rec. G.958), Tandem Connection patterns (ITU-T Rec. G.707),

and Non-frame patterns. Also, APS switching time testing

(ITU-T Rec. G.707, G.783, and G.842), Overhead testing and

Alarm detection are supported.

Frame Memory and Capture (Option)

The MP1570A can be used to edit and analyze up to 64 frames

of data (or up to 26 frames of data at 10 Gbit/s).

IP-over-SONET/SDH (Option)

The IP/PPP packet generation/analysis function uses the frame

memory function: The Tx side transmits the SONET/SDH frame

data in which the IP/PPP packet is written to the payload

(Concatenation*). The Rx side captures the SONET/SDH

frame data into the frame memory (option), and analyses the

IP packet.

STM-64c/OC-192c, STM-16c/OC-48c, STM-4c/OC-12c, STM-1c/OC-3c

Enhanced Through-Modes

The MP1570A enables the user to select one of the four

different types of through-modes that it offers: (1) Transparent,

(2) Overhead/Overwrite, and (3) Payload/Overwrite.

The user can also insert various errors and alarms into the

through signals.

Error Analysis (Error Performance)

The MP1570A enables the user to perform error measurement

conforming to ITU-T Rec. G.821, M.2100, G.826, M.2101,

M.2110, and M.2120.

Frequency and Optical Power Measurements

The MP1570A can measure received frequencies and display

measurement results in a graph. If an optical interface plug-in

unit is installed, the MP1570A can measure the absolute and

relative values of the optical power.

Jitter Generation and Measurement

The MP1570A can measure jitter tolerance and jitter transfer

characteristics in conformance with ITU-T Rec.

G.823/G.824/G.825/G.958, and Bellcore 253/499. It displays

the measurement results as numeric values and as a graph,

allowing the user to evaluate them easily.

Various wander generation functions (Option)

Various wander generations for evaluation are available: such

as TDEV wander tolerance measurement and TDEV wander

transfer characteristics measurement that were regulated by

ITU-T, ANSI, Bellcore, and ETSI.

Variable-type TDEV wander generation: All 38 types of TDEV

masks regulated by ITU-T, ANSI, Bellcore and ETSI are avail-

able as preset data. User-specified TDEV mask generation is

also available.

Phase transient: Changes the phase by an inclination of

A (1 – e

–63.7t

). Moreover, the maximum phase shift quantity

can be set freely. (A: maximum phase shift)

ATM Pattern Generation and Measurement

The MP1570A can test, not only the cell performance but also

measures the cell delay time, CDV, and cell traffic. For OAM

testing, it can generate and detect the AIS, RDI, and continuity

check cells for F4 and F5 flows. It can also generate loopback

and performance-monitoring cells which conform to ITU-T Rec.

I.610.

IP-over-ATM (Option)

The IP packet generation/analysis function uses the ATM unit

cell memory function: The Tx side transmits the AAL5 data in

which the IP packet is written to AAL5 payload. The Rx side

captures the data of cells into the cell memory, and analyses

the IP packet.

Supports SDH, SONET, and Japan Modes in One

Frame (Option)

The MP1570A allows the user to set up the measurement of

SDH, SONET, and 384k Japan mapping in one frame.

The user can set a signaling pattern (multi-frame pattern of 8

frames or 64 frames) for Japanese mapping measurement.

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